By Peter W. Hawkes
Advances in Imaging and Electron Physics merges long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This sequence beneficial properties prolonged articles at the physics of electron units (especially semiconductor devices), particle optics at low and high energies, microlithography, snapshot technology and electronic picture processing, electromagnetic wave propagation, electron microscopy, and the computing tools utilized in most of these domain names
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Additional resources for Advances in Imaging and Electron Physics, Vol. 147
For more details of the EBIC technique, see Leamy (1982), Newbury et al. (1986), or Parish (2006). SCANNING CATHODOLUMINESCENCE MICROSCOPY 29 G. Additional Background Material The previous section provided a brief overview of the most important background points regarding CL in the electron microscope. This section includes references to previously published reviews but with more detail. First, the review article (Yacobi and Holt, 1986) and monograph (Yacobi and Holt, 1990) of Yacobi and Holt are valuable resources and discuss the basics already reviewed in more detail.
In terms of CL, the equation should be rewritten as IPEAK ∝ ibm . (24) From the value of the power-law exponent m, a solid-state process that leads to the emission peak can be determined. In general, when 1 m < 2, the emission is a free- or bound-exciton or direct band-edge emission; when m < 1, the emission is a free-to-bound defect-type or DAP-type emission. 36 PARISH AND RUSSELL (a) (b) F IGURE 19. 4-eV peak. (b) IPEAK ∝ ibm analyses of the current-resolved data. ) © 2001 American Institute of Physics.
A modernized version of this system, implemented on a field-emission SEM, is described by Sekiguchi (2002). Lee et al. (2005) used an electron microprobe to collect CL and X-ray data simultaneously. The microprobe had an optical microscope confocal with the electron gun, and this was used to collect CL data. Although this type of system collects less light than the mirror-based systems discussed previously, microprobes apply very large beam currents (∼nanoamps to tens 24 PARISH AND RUSSELL of nanoamps) to their samples in order to excite X-rays for analysis, which results in comparatively strong CL signals.