Download Atomic Force Microscopy in Adhesion Studies by J. Drelich, Kash L. Mittal PDF

By J. Drelich, Kash L. Mittal

On the grounds that its discovery, Atomic strength Microscopy (AFM) has develop into a method of selection for non-destructive floor characterization with sub-molecular solution. The AFM has additionally emerged as a problem-solving device in purposes appropriate to particle-solid and particle-liquid interactions, layout, fabrication, and characterization of latest fabrics, and improvement of recent applied sciences for processing and amendment of fabrics. This quantity is a finished evaluation of AFM thoughts and their software in adhesion reviews.

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So, it can be clearly seen that the JKR and DMT models are two special cases of the MD model. + The dimensionless load parameter in nano-contact problems 71 Figure 7. Effect of applied load P on nano-indentation tip radius ratio in JKR, DMT and MD models when ,I= 5 and A y R = 100 nJ/m. Figure 8. 5 and A y R = 100 nJ/m. 12 X. Shi and Z-P. Zhao 5. CONCLUSION We analyzed the influences of the dimensionless load parameter, = P / ( nA y R ) , and the transition parameter, A, on the nano-contact area, and we also validated the importance of the work of adhesion through comparison of the JKR, DMT and MD models with the Hertz model.

1. INTRODUCTION In recent years there has been considerable interest in the mechanical characterization of thin-film systems and small volumes of materials using depth-sensing indentation tests which utilize either spherical or pyramidal indenters [l, 21. Usually, to obtain values for hardness and elastic modulus of the specimen material from the experimental values of indenter load and depth of penetration is the principal goal N) range of such testing. The forces involved are usually in the millinewton and are measured with a resolution of a few nanonewtons ( N), and the depths of penetration are in the order of nanometers, hence the term “nano-indentation” (lop9m).

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